2003 Phi 690 Field Emission Scanning Auger Nanoprobe

Auger Electron Spectroscopy (AES) is an analytical technique used to determine the elemental composition and the chemical state of the atoms in the surface region of a solid material.

Applications:

*Surface analysis (top ten layers) of solid conductive surfaces
*Element distribution mapping with high spatial resolution
*High resolution depth profiling

Specifications
Chamber base pressure: 5*10-10 Torr
Electron beam diameter (analytical resolution): 21nm10nA, 10kV; 12nm10nA, 20kV
Dark space resolution (image resolution): 6nm1nA, 20kV; 8.5nm10nA, 20kV
Sensitivity: 700kcps10nA, 10kV
Energy resolution < 0,5 % Floating extractor ion gun, ion beam diameter @5kV < 100µm
Compucentric Zalar Rotation for high resolution depth profiles
Original Purchase price: $988,000.00

Ref: ELFESAN


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